ieeexplore.ieee.org
ieeexplore.ieee.org
researchgate.net
researchgate.net
research.aalto.fi
research.aalto.fi
Aalto University's research portal
https://research.aalto.fi › en › publications › fatigue-crack-networks-in-die-attach-layers-of-igbt-modules-under
link.springer.com
ui.adsabs.harvard.edu
link.springer.com
x-mol.com
sys-ele.com
Systems Engineering and Electronics
https://www.sys-ele.com › EN › 10.12305 › j.issn.1001-506X.2024.09.15
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